Contactless determination of doping concentration and resistivity of silicon wafers with cavity ring-down technique

Contactless Characterization of Silicon Wafers

Contactless measurements are attractive and more commonly used because they do not contaminate the sample and generally do not require sample preparation. After an outline of the more common contactless characterization techniques, I will discuss a few of these in more detail. In particular resistivity or doping density profiling, minority carrier lifetime, stress, temperature, layer thickness,...

Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements

architecture and engineering of nanoscale sculptured thin films and determination of their properties

چکیده ندارد.

Cavity Ring-down Biosensing

Cavity ring-down spectroscopy (CRDS) is an established technique for gases sensing that is newly emerging in the field of optical biosensing. This approach measures changes in the rate of decay of light injected into an optical resonator and relates them to optical loss along its length. This principle has recently been adapted for use in liquids, providing a highly sensitive method for quantit...

determination of some physical and mechanical properties red bean

چکیده: در این تحقیق، برخی خواص فیزیکی و مکانیکی لوبیا قرمز به-صورت تابعی از محتوی رطوبت بررسی شد. نتایج نشان داد که رطوبت بر خواص فیزیکی لوبیا قرمز شامل طول، عرض، ضخامت، قطر متوسط هندسی، قطر متوسط حسابی، سطح تصویر شده، حجم، چگالی توده، تخلخل، وزن هزار دانه و زاویه ی استقرار استاتیکی در سطح احتمال 1 درصد اثر معنی داری دارد. به طوری که با افزایش رطوبت از 54/7 به 12 درصد بر پایه خشک طول، عرض، ضخام...